- Method for creating nanoscale functional defects in 2D materials
- Provides the ability to control the size, position and chemistry of a defect
- Does not require high heat or other high-energy processes (such as plasma or highpower lasers)
The University of Central Florida invention describes a method to create functional defects in 2D materials with the ability to control their dimensions and composition. The invention uses a nanoscale tip, such as the tip of an atomic force microscopy cantilever, and light to manipulate the environment (humidity, gas, solvent, temperature, force applied, and wavenumber) directly beneath the tip for defect creation. This approach can be used to pattern arrays of nanoscale defects of selected compositions in 2D materials, with the ability to control the size and chemistry of the defects without high heat or other high-energy processes (such as plasma or high-power lasers).
The research team is seeking partners for licensing and/or research collaboration.
Stage of Development
Nimi: Andrea Adkins